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ERIC Number: ED238945
Record Type: RIE
Publication Date: 1983-Nov
Pages: 238
Abstractor: N/A
Reference Count: 0
Testing in the Nation's Schools: Collected Papers. Research Into Practice Project.
Baker, Eva L.; Herman, Joan L.
The Center for the Study of Evaluation, of the Graduate School of Education at the University of California at Los Angeles (CSE) hosted a two day conference on "Paths to Excellence: Testing and Technology" on July 14-15, 1983. Attended by over 100 educational researchers, practitioners, and policymakers, the first day of the conference focused on issues in educational testing; day two explored the status and future of technology in schools. This document presents the collected papers from the first day of the conference. Presentations focused on CSE's study of teachers' and principals' use of achievement testing in the nation's schools. The study provided basic data about the nature and frequency of classroom testing, the purposes for which test results are used, principals' and teachers' attitudes toward testing, and local contexts supporting the use of tests (e.g., amount of staff development, testing resources, leadership support). The findings were presented at the conference, and presenters were asked to provide their interpretations of the data and their perspectives on their implications for national, state, and/or local testing policies. One speaker, William Coffman, was asked to provide context for the conference by considering the study in the light of the history of research on educational testing. (PN)
Publication Type: Collected Works - Proceedings; Information Analyses
Education Level: N/A
Audience: Practitioners; Researchers; Policymakers
Language: English
Sponsor: National Inst. of Education (ED), Washington, DC.
Authoring Institution: California Univ., Los Angeles. Center for the Study of Evaluation.
Identifiers: Data Interpretation
Note: Papers presented at the Paths to Excellence: Testing and Technology Conference (Los Angeles, CA. July 14-15, 1983). For related document, see TM 840 043.