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ERIC Number: ED219407
Record Type: RIE
Publication Date: 1982-Feb
Pages: 26
Abstractor: N/A
Reference Count: 0
A k-Sample Extension to Fligner's Class of Tests For Scale.
Koffler, Stephen L.
Too often researchers rely upon the classical normal theory parametric tests to analyze non-normal data, even though the tests may not be robust to violations of that assumption. Fligner's class of two-sample tests for scale is an important development because the test is distribution-free and has desirable properties. This paper outlines the development of the k-sample extension of the two-sample Fligner class of tests, based upon the generalized Puri model. Assuming rejection of the null hypothesis under test, appropriate post hoc procedures for the test were developed based on the chi-square analogue to the Scheffe theorem. (Author/BW)
Publication Type: Reports - Research
Education Level: N/A
Audience: N/A
Language: English
Sponsor: N/A
Authoring Institution: N/A
Identifiers: Fligner (M A); Normal Distribution; Post Hoc Methods; Violation of Assumptions