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ERIC Number: ED218345
Record Type: RIE
Publication Date: 1982-Mar
Pages: 20
Abstractor: N/A
Reference Count: 0
ISBN: N/A
ISSN: N/A
Assessing Inconsistencies in Standard Setting with the Angoff or Nedelsky Technique.
van der Linden, Wim J.
A latent trait method is presented to investigate the possibility that Angoff or Nedelsky judges specify inconsistent probabilities in standard setting techniques for objectives-based instructional programs. It is suggested that judges frequently specify a low probability of success for an easy item but a large probability for a hard item. The responses of 156 pupils to a 25-item test from a tenth grade physics course were inspected by eight Angoff and nine Nedelsky judges. The latent trait analysis produced 18 items showing a satisfactory fit to the Rasch model. Serious errors of specification were found and errors were considerably larger for the Nedelsky technique. Special difficulties with the Nedelsky judges are discussed. Applications of the latent trait method are discussed. (Author/CM)
Publication Type: Speeches/Meeting Papers; Reports - Research
Education Level: N/A
Audience: N/A
Language: English
Sponsor: N/A
Authoring Institution: N/A
Identifiers: Angoff Methods; Nedelsky Method
Note: Presentation of this paper supported by a grant from the Dutch Foundation of Educational Research.