ERIC Number: ED218320
Record Type: RIE
Publication Date: 1981
Reference Count: 0
Potential Sources of Bias in Dual Language Achievement Tests.
Potential sources of bias in dual language achievement tests were identified and examined. Content, concepts, and vocabulary presented in monolingual English curricula may differ drastically from those presented in bilingual curricula. The Spanish or English versions of the Comprehensive Tests of Basic Skills (CTBS) were administered to 1259 students in 81 second, third, fifth and sixth grade classrooms in 5 California school districts. Statistical and content analysis provided evidence of three possible sources of bias: problems inherent in translation, the match between the test and instructional material, and intervening cultural values. Dual language tests also raise the question of whether, and how, standard achievement tests can match the wide variety of curricula used by American schools. Further empirical studies are necessary to isolate the cause of bias for individual test items, whether in the CTBS or any other test. Studies providing more information concerning biases stemming from cultural interference and curricular match are needed in order to develop a methodology beyond the statistical approaches now available. (PN)
Publication Type: Reports - Research
Education Level: N/A
Sponsor: National Inst. of Education (ED), Washington, DC.
Authoring Institution: California Univ., Los Angeles. Center for the Study of Evaluation.
Identifiers: Comprehensive Tests of Basic Skills