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ERIC Number: ED206723
Record Type: RIE
Publication Date: 1979-Jul
Pages: 37
Abstractor: N/A
Reference Count: 0
Effects of Test Length and Advancement Score on Several Criterion-Referenced Test Reliability and Validity Indices. Laboratory of Psychometric and Evaluation Research Report No. 86.
Eignor, Daniel R.; Hambleton, Ronald K.
The purpose of the investigation was to obtain some relationships among (1) test lengths, (2) shape of domain-score distributions, (3) advancement scores, and (4) several criterion-referenced test score reliability and validity indices. The study was conducted using computer simulation methods. The values of variables under study were set to be typical of those often used or obtained in practice. The reliability and validity indices (decision consistency, kappa, decision accuracy, predictive validity, and efficiency) are among the most useful indices for criterion-referenced test developers and evaluators. Practical guidelines are offered for using results obtained from the investigation to determine suitable lengths of criterion-referenced tests in specific assessment situations. (Author)
Publication Type: Speeches/Meeting Papers; Reports - Research
Education Level: N/A
Audience: N/A
Language: English
Sponsor: National Inst. of Education (DHEW), Washington, DC.
Authoring Institution: Massachusetts Univ., Amherst. School of Education.
Identifiers: Binomial Error Model
Note: Paper presented at the Annual Meeting of the National Council on Measurement in Education (San Francisco, CA, 1979).