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ERIC Number: ED205577
Record Type: RIE
Publication Date: 1980-Nov
Pages: 35
Abstractor: N/A
Reference Count: 0
ISBN: N/A
ISSN: N/A
Using the Rasch Model to Examine Item Bias.
Yeh, Jennie P.; Conklin, Jon
To test for item bias, it must be determined whether an item fits the model. Two approaches to defining bias within the framework of the Rasch model are examined. One compares within-group fit mean squares and the other utilizes a between-group fit statistic. Results from both approaches overlap somewhat, but are distinct in many different but complimentary, and both may be useful to the analyst interested in both aspects of the bias issue. These two indices are by no means the only indices to be used within the Rasch model framework. Apparently, a promising alternative approach might focus on person-fit rather than item-fit. (Author/GK)
Publication Type: Reports - Research
Education Level: N/A
Audience: N/A
Language: English
Sponsor: National Inst. of Education (ED), Washington, DC.
Authoring Institution: California Univ., Los Angeles. Center for the Study of Evaluation.
Identifiers: Rasch Model