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ERIC Number: ED198163
Record Type: RIE
Publication Date: 1979-Dec
Pages: 27
Abstractor: N/A
Reference Count: 0
ISBN: N/A
ISSN: N/A
Implications for Minority Groups of the Movement Toward Minimum-Competency Testing. A Symposium presented at the 1979 Annual Meeting of the National Council on Measurement in Education.
ERIC Clearinghouse on Tests, Measurement, and Evaluation, Princeton, NJ.
Proceedings of the symposium on Implications for Minority Groups of the Movement Toward Minimum-Competency Testing (MCT) include the following papers: (1) "Implications of Minimum-Competency Testing for Minority Students" by A. Graham Down, who asserts that MCT offers more hope than any development in public school policy since 1954 for realizing the educational aspirations of minority students and parents; (2) "Do Minorities Embrace the Concept of Minimum Competency?" by Ronald H. Lewis, who answers in the affirmative and suggests that a system of competency-based education is needed, not merely MCT; (3) "Minimum-Competency Programs, Protected Classes, and Federal Agencies" by M. Hayes Mizell who discusses two examples of federal agencies which administer laws fundamental to the protection and advancement of the educational interests of minority children; (4) "Minimum-Competency Testing: The Newest Obstruction to the Education of Black and Other Disadvantaged Americans" by Hugh J. Scott who insists that the conceptual deficiencies of MCT as well as the potential negative consequences it may engender are sufficient reasons for broad opposition within the educational profession; and (5) "Reflections on the Issues and a Proposal for Dealing with Them" by Robert A. Feldmesser, organizer of the symposium. (RL)
ERIC Clearinghouse on Tests, Measurement, and Evaluation, Educational Testing Service, Princeton, NJ 08541 ($2.50 each).
Publication Type: Collected Works - Proceedings; Opinion Papers
Education Level: N/A
Audience: N/A
Language: English
Sponsor: National Inst. of Education (DHEW), Washington, DC.
Authoring Institution: ERIC Clearinghouse on Tests, Measurement, and Evaluation, Princeton, NJ.
Identifiers: N/A
Note: Each paper included is available through ERIC as follows: ED 178 616, ED 178 615, ED 178 617, and ED 178 618.