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ERIC Number: ED189161
Record Type: RIE
Publication Date: 1980-Apr
Pages: 18
Abstractor: N/A
Reference Count: 0
A Regression Analysis of Test Bias on the Stanford-Binet Intelligence Scale.
Reynolds, Cecil R.; And Others
Regression lines for the prediction of Wide Range Achievement Test (WRAT) standard scores by Stanford-Binet Intelligence Scale scores were compared across race for matched groups of 60 black and 60 white children selected from among a large number of children who had been referred for psychological services by their classroom teachers. The white children were matched to the black children on the basis of sex, age, and IQ. The definition proposed for bias was significant differences in regression lines using Potthoff's technique that tests for slopes and intercepts simultaneously. According to this significance test, regression lines for blacks and for whites did not differ significantly for the prediction of WRAT scores. (Author/CTM)
Publication Type: Speeches/Meeting Papers; Reports - Research
Education Level: N/A
Audience: N/A
Language: English
Sponsor: N/A
Authoring Institution: N/A
Identifiers: Stanford Binet Intelligence Scale; Wide Range Achievement Test
Note: Paper presented at the Annual Meeting of the American Educational Research Association (64th, Boston, MA, April 7-11, 1980).