ERIC Number: ED187740
Record Type: RIE
Publication Date: 1978-Nov-9
Reference Count: 0
Summary of the Fall 1978 Conference of the National Consortium on Testing; October 23-24, 1978.
Discussions at the National Consortium on Testing conference are summarized. Updates on recent and upcoming events are given by Jeff Schiller (National Institute of Education), Doug Whitney (American Council on Education), John Maxwell (National Council of Teachers of English), Dorianne Almann (National Science Teachers Association), Eric Gardner (National Council on Measurement in Education), and Walt Haney (Huron Institute): Ron Hambleton's presentation on the state of criterion-referenced testing and Banesh Hoffman's remarks on declining writing ability are summarized. Alternative approaches to educational assessment are discussed by Vito Perrone, George Hein, Fritz Mosher, and Judah Schwartz, who describes Project TORQUE. Topical sessions on minimum competency testing and standards for tests and test use are led by George Madaus and Walt Haney, respectively. Deborah Coates also discusses the National Academy of Science's Committee on Ability Testing. Appendices include a summary of California Testing legislation, guidelines for evaluating criterion-referenced tests and test manuals, bibliographies, standards for test use, newsletters/announcements, and an outline for reviews of commonly used achievement and diagnostic test series. (GDC)
Descriptors: Alternative Assessment, Criterion Referenced Tests, Educational Assessment, Educational Testing, Evaluation Methods, Minimum Competency Testing, Professional Associations, Standardized Tests, Standards, State Legislation, Test Reviews, Test Selection, Testing Problems
Huron Institute, National Consortium on Testing, 123 Mt. Auburn Street, Cambridge, MA 02138 ($5.00)
Publication Type: Opinion Papers; Collected Works - Proceedings
Education Level: N/A
Authoring Institution: Huron Inst., Cambridge, MA.
Identifiers: California; National Consortium on Testing; Project TORQUE
Note: For related documents, see TM 800 235 and TM 800 237.