ERIC Number: ED178566
Record Type: RIE
Publication Date: 1978
Reference Count: 0
An Empirical Investigaiton of Six Methods for Examing Test Item Bias. Final Report.
Merz, William R.; Grossen, Neal E.
Six approaches to assessing test item bias were examined: transformed item difficulty, point biserial correlations, chi-square, factor analysis, one parameter item characteristic curve, and three parameter item characteristic curve. Data sets for analysis were generated by a Monte Carlo technique based on the three parameter model; thus, four parameters were controlled: total score distributions, item difficulties, item discriminations, and guessing. Only the difficulty parameter was biased. Results indicated that transformed item difficulty had highest correlations with generated bias. The three-parameter item characteristic curve and the one parameter item characteristic curve were next highest, followed by factor analysis, then chi-square. Point biserial correlation functioned erratically. Results of the analysis were compared and recommendations were made on the use of each method. (Author/MH)
Publication Type: Reports - Research
Education Level: N/A
Sponsor: National Inst. of Education (DHEW), Washington, DC.
Authoring Institution: Sacramento State Univ. Foundation, CA.
Identifiers: Chi Square; One Parameter Model; Point Biserial Correlation; Three Parameter Model