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ERIC Number: ED161335
Record Type: RIE
Publication Date: 1978-May
Pages: 25
Abstractor: N/A
Reference Count: 0
ISBN: N/A
ISSN: N/A
Admissions-Yield and Persistence Analysis. AIR Forum Paper 1978.
Ramist, Leonard
Data from the college Board's Admissions Test Program (ATP) Summary Reports are used to analyze the student market attraction for ATP report designations, the application rate, the acceptance rate, the enrollment yield, and the dropout rate for 254 different student groups for 25l colleges. Student groups are defined in terms of their College Board test scores and self-reported high school record, socioeconomic characteristics, college plans, and skills and abilities. The results are aggregated by classifications based on the colleges' academic selectivity level, their size, and the proportions of their students that are from their state and their region. (Author)
Publication Type: Speeches/Meeting Papers
Education Level: N/A
Audience: N/A
Language: English
Sponsor: N/A
Authoring Institution: N/A
Identifiers: Admissions Test Program; Selectivity
Note: Paper presented at the annual Association for Institutional Research Forum (18th, Houston, Texas, May 21-25, 1978)