ERIC Number: ED156310
Record Type: RIE
Publication Date: 1977-Feb
Reference Count: 0
The Nature and Process of Development in Averaged Visually Evoked Potentials: Discussion on Pattern Structure.
Izawa, Shuji; Mizutani, Tohru
This paper examines the development of visually evoked EEG patterns in retarded and normal subjects. The paper focuses on the averaged visually evoked potentials (AVEP) in the central and occipital regions of the brain in eyes closed and eyes open conditions. Wave pattern, amplitude, and latency are examined. The first section of the paper reviews previous research on developmental changes in AVEP patterns. The second section of the paper presents a developmental and comparative study of the AVEPs of retarded and normal children in a closed eyes, diffuse white light flash condition. Results suggest that EEG patterns from the central region of the brain develop more slowly than those of the occipital region. Occipital patterns tend to be fairly similar for both retarded and normal subjects. Central recordings, however, indicate striking differences in the long latency negative and positive waves of the retarded subjects. The third section of the paper examines the AVEP patterns of retarded and normal subjects during two eyes open conditions: light flash (Rest) and a choice reaction task (CRT). Results from this study suggest similar but developmentally retarded AVEP patterns for the retarded in comparison to the normal subjects in the occipital region for both Rest and CRT. Retarded-normal differences are found for negative wave patterns in the central brain region by comparing CRT to the Rest condition. Results are discussed in terms of arousal and attention deviations which may be indicated in the AVEP patterns of the retarded subjects. (BD)
Publication Type: Reports - Research
Education Level: N/A
Authoring Institution: Tokyo Gakugei Univ. (Japan). Research Inst. for the Education of Exceptional Children.
Identifiers: Averaged Visually Evoked Potentials
Note: Parts may be marginally legible due to type size