ERIC Number: ED052264
Record Type: RIE
Publication Date: 1971
Reference Count: 0
Proceedings of the 1970 Invitational Conference on Testing Problems.
Educational Testing Service, Princeton, NJ.
The conference theme was "The Promise and Perils of Educational Information Systems," defined as collections of test data on knowledges, skills, interests, and attitudes maintained for the purpose of educational decision making. Topics covered were: "Longer Education: Thinner, Broader, or Higher" (Fritz Machlup); "Testing: Americans' Comfortable Panacea" (Theodore R. Sizer); "Social and Cultural Change and the Need for Educational Information: The Futurist's View" (Herman Kahn); "School Testing to Test the Schools" (Richard M. Jaeger); "National Assessment" (Robert E. Stake); "Bayesian Considerations in Educational Information Systems" (Melvin R. Novick); "Temporal Changes in Treatment-Effect Correlations: A Quasi-Experimental Model for Institutional Records and Longitudinal Studies" (Donald T. Campbell); "Higher Education: For Whom? At Whose Cost?" (Carl Kaysen); "Social Accounting in Education: Reflections on Supply and Demand" (David K. Cohen); "Ethical and Legal Aspects of the Collection of Educational Information" (David A. Goslin); and "Test Information as a Reinforcer of Negative Attitudes Toward Black Americans" (Elias Blake, Jr.). (AG) Aspect of National Assessment (NAEP) dealt with in this document: Program Description (Program Goals).
Descriptors: Bayesian Statistics, Bias, Blacks, Conferences, Data Collection, Decision Making, Educational Improvement, Educational Needs, Evaluation, Higher Education, Information Systems, Longitudinal Studies, Measurement Techniques, Models, Negative Attitudes, Social Change, Speeches, Testing, Testing Problems
Educational Testing Service, Princeton, New Jersey 08540
Publication Type: N/A
Education Level: N/A
Authoring Institution: Educational Testing Service, Princeton, NJ.
Identifiers: National Assessment of Educational Progress
Note: From the Proceedings of the 1970 Invitational Conference on Testing Problems, New York, New York, October 31, 1971