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ERIC Number: ED044761
Record Type: RIE
Publication Date: 1970-Oct
Pages: 15
Abstractor: N/A
Reference Count: 0
ISBN: N/A
ISSN: N/A
The Relationship Between Memory Span, Long-Term Memory and Problem Solving. Final Report.
Whimbley, Arthur
Six studies were performed investigating the relationship between digit span (DS) capacity and other memory and problem solving tasks: (1) Ss were administered a DS test, an aurally presented mental addition test, a similar multiplication task, and a written timed division test. DS correlated only with the second; (2) Ss were required to interchange mentally the letters in the corners of a square. This task did not correlate with DS; (3) free recall of series of 10 two-digit numbers did not correlate with DS; (4) Ss were presented multiple series of two-digit numbers, from five pairs up to 10 pairs. DS correlated highest using sets of six and seven number pairs; (5) the relationship between DS and memory for visual patterns was examined; with no correlation; (6) the relationship between DS and verbal memory was investigated using the immediate recall, recall after one presentation of a series, vocabulary, and DS. The first three tests correlated significantly with each other while DS did not correlate significantly with any of the three. It was concluded that a DS test measures a narrow ability which does not play a significant role in most other problem solving tasks. (Author/CJ)
Publication Type: N/A
Education Level: N/A
Audience: N/A
Language: N/A
Sponsor: Office of Education (DHEW), Washington, DC. Bureau of Research.
Authoring Institution: California State Coll., Hayward.
Identifiers: N/A