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ERIC Number: ED038669
Record Type: RIE
Publication Date: 1970-Mar-3
Pages: 27
Abstractor: N/A
Reference Count: 0
Assessing the Personality Structure of the Puerto Rican Secondary School Student.
Poggio, John P.; Nuttall, Ronald L.
The study dealt with the personality structure of Puerto Rican junior and senior high school students examined in one school district in Puerto Rico. The instrument used was a translated and adapted form of the HSPQ, Form A. From a scree test, more than 14 factors, probably 16 factors were to be found in the data. Rotating 14 factors to an oblique promax solution allows four HSPQ Factors (B, D, H, and I) to be matched to promax factors. Using a factor mandate it was possible to rotate to a moderately good fit of the 14 HSPQ factors. In only one case (Factor O) was the Coefficient of Congruence higher off the major diagonal than on it. Factors B, Intelligence and I, Esthetic Sensitivity were especially well matched. However, when the correlations among these oblique factors were examined, essentially no similarity appeared between the Puerto Rican date and the factor intercorrelations appearing in the HSPQ Handbook. Examination of the mean raw scores for the Puerto Rican students as contrasted to the Handbook reports for American and British students indicates that Puerto Ricans are more like the Americans than like the British, and are generally less Excitable, less Dominant, Less Enthusiastic, more Esthetically Sensitive, less Individualistic, less Guilt-Prone, and have greater Will-power than either the American or the British samples. (Author)
John P. Poggio, or Ronald L. Nuttal, School of Education, Boston College, Chestnut Hill, Massachusetts 02167
Publication Type: N/A
Education Level: N/A
Audience: N/A
Language: N/A
Sponsor: N/A
Authoring Institution: American Educational Research Association, Washington, DC.; Boston Coll., Chestnut Hill, MA. School of Education.
Identifiers: N/A
Note: Paper presented at American Educational Research Association Convention, Minneapolis, Minnesota, March 2-6, 1970